Jiwu Lu is the full Professor of the School of Design at Hunan University, where he teach "Hardware and Design Innovation of Internet of Things", "Project Design of Intelligent Equipment Module", "Creative Programming and Design" and other courses. He is a member of the Academic Committee of the school, and the head of the Intelligent Equipment research group. He was born in Liuyang, Hunan.
Research fields：
Edge computing and chip design in Industrial Internet and Internet of Things.
Micro energy acquisition system.
Power semiconductor device fabrication and integrated circuit simulation design.
Education and academic experience：
2015-Present: Hunan University
Advanced CMOS Research Institute, National Institute of Standards and Technology (NIST), Guest Reseacher
Twente University, Ph.D of Electronic Engineering
Siegen University, Master of Physics
Zhejiang University, Bachelor of Physics
Research Projects：
2020-Present: Presides over “Research And Development Of On-Board Battery Operation And Maintenance Chip, Algorithm And Intelligent Cloud Management System For Rail Transit” (High-Tech Industry Technology Innovation Leading Plan Of Hunan Province)
2020-Present: Presides over “Research On Gate Oxygen Quality Reliability Of Silicon Carbide Power MOSFET” (The project of The National Natural Science Foundation of China)
2019-Present: Presides over “Hunan Huxiang High-Level Talent Focus Project-Innovative Talents”
2019-Present: Presides over national project “Research On Application Scenarios Analysis, Reuse Life And Economic Evaluation Technology Of Echelon Utilization Power Battery”
2019-Present: Presides over national project “Design Of Low Power Phase Change Memory Based On Artificial Intelligence And Multi-Scale Computing”
2017-Present: Participates in Hunan Provincial Science And Technology Plan Major Special Project “Research And Industrialization On SiC Key Equipment And Power Electronic Device Technology”
2018-Present: Presides over project “Online Payment And Status Monitoring System” with Changsha Economic development Zone Enterprises (Hunan Changxiang industry CO.Ltd)
Teaching Courses：
Project Design of Intelligent Equipment Module
Internet of Things Hardware and Design Innovation
Creative Programming and Design
New Product Development (All English Teaching)
Semiconductor Integrated Circuit Development and Leading-edge Technology (General Education Course)
Internet of Things Edge Intelligent Hardware Design and Implementation
Representative academic achievements：
2019: Hunan Huxiang High-Level Talent Focus Project-Innovative Talents
2002-2005: Won DAAD Scholarship To Study For Master's Degree At Siegen University In Germany
Professor Lu has been working on advanced complementary metal-oxide-semiconductor (CMOS) integrated circuits since he studied in Europe and the United States more than 10 years ago, including device reliability circuit testing, ultra-fast circuit design and testing, micro energy chips.
Professor Lu worked on "Micro-Energy Harvesting Integrated Chip" for self-charging wireless network sensors in the Internet of Things. This work has been reported by 80 online medias and 5 print medias, including the biggest newspaper in the Netherlands. The "Fast Test Circuit Test System" led by the American National Standards Institute broke the world record of the electrical performance test speed of the device at that time, and obtained the electrical characteristic parameters of the device in the real CPU working state for the first time. Its related subsequent improvement technology has been patented in China, and is currently undergoing industrialization transformation in China.
Representative papers are as follows:
J. Lu, W. Liu, d. W. Van, C. H. M, A. Y. Kovalgin, Y. Sun, R. E. I. Schropp, J. Schmitz*, Above-CMOS a-Si and CIGS solar cells for powering autonomous microsystems, IEEE Electron Devices Meeting, U.S.A, San Francisco, 2010,12.02~12.05
J. W. Lu, C. Vaz, J. P. Campbell, and J. T. Ryan, "Device-level PBTI-induced timing jitter increase in circuit-speed random logic operation," IEEE VlSI Technology, 2014, pp. 1-2.
Yanyan Zhang, Ran Cheng, Dong Yi, Jiwu Lu*， Yi Zhao，“Thermal Conductivity Characterization of Ultra-thin Silicon Film Using Ultra-fast Transient Hot Strip Method” Chinese Physics B，2019，（accepted, RefNo. 190469）
J. Liu, M. Shi, J. Lu*, and M. P. Anantram, "Analysis of electrical-field-dependent Dzyaloshinskii-Moriya interaction and magnetocrystalline anisotropy in a two-dimensional ferromagnetic monolayer," Physical Review B, vol. 97, p. 054416, 02/16/ 2018
J. B. Sun and J. W. Lu*, "Interface Engineering and Gate Dielectric Engineering for High Performance Ge MOSFETs," Advances in Condensed Matter Physics, p. 9, 2015
J. Lu, G. Jiao, C. Vaz, and J. P. Campbell, "PBTI-Induced Random Timing Jitter in Circuit-Speed Random Logic," IEEE Transactions on Electron Devices, vol. 61, pp. 3613-3618, 2014.
G. F. Jiao#, J. W. Lu#, J. P. Campbell, and J. T. Ryan, "Device-Level Experimental Observations of NBTI-Induced Random Timing Jitter," Device & Materials Reliability IEEE Transactions on, vol. 14, pp. 972-977, 2014. （#co-first author）
J. Lu#, W. Liu, A. Y. Kovalgin, Y. Sun and J. Schmitz*, "Integration of Solar Cells on Top of CMOS Chips—Part II: CIGS Solar Cells," IEEE Transactions on Electron Devices, 2011, 58(8):2620-2627
J. Lu#,, A. Y. Kovalgin, K. H. M. V. D. Werf, R. E. I. Schropp and J. Schmitz*, Integration of Solar Cells on Top of CMOS Chips Part I: a-Si Solar Cells, IEEE Transactions on Electron Devices, 2011, 58(7): 2014-2021.
G. F. Jiao#, J. W. Lu#, J. P. Campbell, J. T. Ryan, K. P. Cheung, C. D. Young, Bersuker, G, "Circuit speed timing jitter increase in random logic operation after NBTI stress," IEEE International Reliability Physics Symposium, 2014, pp. 6B.1.1-6B.1.4（#co-first author）
Academic and social part-time：
2019-Present: Intelligent Design Branch of Hunan Industrial Design Association, President
2015-Present: Member of Hunan Electrotechnical Association
2011-Present: Member of IEEE Electronic Devices Association
2018-Present: Ministry of Industry and Information Technology Xinhuo Innovation Base (Platform), Expert Mentor
2018-Present: Changsha Integrated Circuit Design Base, Entrepreneurship Expert Mentor
2019-Present: Changsha New Generation of Semiconductor Integrated Circuit Industry Chain Industry, Commissioner
Reviewer for Several International Journals: IEEE Transaction on Electron Device, IEEE Transaction on Device and Materials Reliability, Journal of Solid State Electronics
